Semiconductor processing methods of forming integrated circuitry memory devices, methods of forming capacitor containers, methods of making electrical connection to circuit nodes and related integrated circuitry

ABSTRACT

In one aspect, the invention provides a method of forming an integrated circuitry memory device. In one preferred implementation, a conductive layer is formed over both memory array areas and peripheral circuitry areas. A refractory metal layer is formed over the conductive layer to provide conductive structure in both areas. According to a preferred aspect of this implementation, the conductive layer which is formed over the memory array provides an electrical contact for a capacitor container to be formed. According to another preferred aspect of this implementation, the conductive layer formed over the peripheral circuitry area constitutes a conductive line which includes at least some of the silicide. In another preferred implementation, the invention provides a method of forming a capacitor container over a substrate. According to a preferred aspect of this implementation, a conductive layer is elevationally interposed between an upper insulating layer and a lower conductive layer over the substrate. The upper insulating layer is etched relative to the interposed conductive layer to form a capacitor container first portion. Subsequently, the interposed conductive layer is etched to form a capacitor container second portion.

TECHNICAL FIELD

[0001] This invention relates to semiconductor processing methods offorming integrated circuitry memory devices, methods of formingcapacitor containers, methods of making electrical connection to circuitnodes and related integrated circuitry.

BACKGROUND OF THE INVENTION

[0002] Integrated memory devices typically include a memory array areaand a peripheral circuitry area. The memory array area constitutes thearea in which information or data is stored. The peripheral circuitryarea constitutes integrated circuitry which, in part, controls orprovides access to the memory array area. One type of integrated memorydevice is a dynamic random access memory (DRAM) device. DRAMs include,as part of the memory array, plural capacitors which are used to storecharges. It is desirable to fabricate integrated circuitry memorydevices to have fairly close, comparable, and repeatable capacitancevalues.

[0003] Stacked DRAM capacitors are typically formed from a plurality oflayers provided over a substrate by etching at least some of the layersto form a desired capacitor container construction. Capacitors arethereafter formed in the etched containers. To increase the capacitancevalues of the subsequently formed capacitors, a timed etch is typicallyconducted to further etch the provided layers after an initial capacitorcontainer definition etch is conducted. Such timed etches can beproblematic for a number of reasons. For example, such etches must becarefully monitored and timed to ensure that the etch does notundesirably extend into adjacent integrated device components, which candestroy the circuit. Thus, control of the etches is of major concern.Another problem is that reproducibility of the depth of such etches canbe difficult to attain given variations in the processing regimes andmaterials used to fabricate the capacitor containers. Thus, a needexists for semiconductor processing methods which enable memory devicesto be fabricated with predictable and readily reproducible capacitancevalues.

[0004] Another problem associated with the fabrication of integratedmemory devices concerns forming electrical connections betweenconductive lines and substrate active areas in peripheral circuitryareas of the memory array. More specifically, it is sometimes desirablefor conductive lines to be electrically connected with substrate activeareas which are disposed elevationally lower over a substrate than therespective conductive lines. Typically, the elevational separationbetween the conductive lines and the substrate active area is due to oneor more layers which are interposed between the conductive lines and thecorresponding active area to which electrical connection is desired.Often such conductive lines do not typically directly overlie the entireactive area with which electrical connection is desired. One prior artsolution is to provide a conductive plug of material which extendsgenerally vertically between and connects with the overlying conductiveline and only a portion of the active area with which electricalconnection is desired. This, however, gives rise to increased resistanceand hence lower conductivity as between the conductive line and theelevationally lower substrate active area. Thus, a need exists toprovide improved semiconductor processing methods and related integratedcircuitry formed thereby with improved conductive connections betweenelevationally separated conductive lines and substrate active areas.

[0005] This invention arose out of concerns associated with formingintegrated memory circuitry, particularly DRAM memory devices, withstandardized and readily reproducible component values, as well asimproving conductive connections between the memory device components.

SUMMARY OF THE INVENTION

[0006] In one aspect, the invention provides a method of forming anintegrated circuitry memory device. In one preferred implementation, aconductively doped layer is formed over both memory array areas andperipheral circuitry areas. A refractory metal layer is formed over theconductively doped layer to provide conductive structure in both areas.According to a preferred aspect of this implementation, the conductivelydoped layer which is formed over the memory array provides an electricalcontact for a capacitor container to be formed. According to anotherpreferred aspect of this implementation, the conductively doped layerformed over the peripheral circuitry area constitutes a conductive linewhich includes at least some of the silicide.

[0007] In another preferred implementation, the invention provides amethod of forming a capacitor container over a substrate. According to apreferred aspect of this implementation, a conductive layer iselevationally interposed between an upper insulating layer and a lowerconductive layer over the substrate. The upper insulating layer isetched relative to the interposed conductive layer to form a capacitorcontainer first portion. Subsequently, the interposed conductive layeris etched to form a capacitor container second portion. Preferably, thefirst etch is substantially selective relative to the interposedconductive layer. Additionally, the second etch is preferablysubstantially selective relative to the lower conductive layer.

[0008] According to another preferred implementation, the inventionprovides a method of forming capacitor containers. According to apreferred implementation, at least three layers of different materialsare formed over a substrate and subsequently etched to form a desiredcapacitor container. According to a preferred aspect, a first of thematerials is etched using a first etching composition which outwardlyexposes at least some of a second of the materials. Preferably, suchexposure is detected whereupon the first etching composition is changedto a second etching composition which is different from the firstetching composition. Accordingly, and utilizing the second etchingcomposition, the second of the materials is etched to outwardly exposeat least some of a third of the materials.

BRIEF DESCRIPTION OF THE DRAWINGS

[0009] Preferred embodiments of the invention are described below withreference to the following accompanying drawings.

[0010]FIG. 1 is a cross-sectional view of a semiconductor wafer fragmentat one processing step in accordance with the invention.

[0011]FIG. 2 is a cross-sectional view of the FIG. 1 semiconductor waferfragment at a processing step subsequent to that shown by FIG. 1.

[0012]FIG. 3 is a cross-sectional view of the FIG. 1 semiconductor waferfragment at a processing step subsequent to that shown by FIG. 2.

[0013]FIG. 4 is a cross-sectional view of the FIG. 1 semiconductor waferfragment at a processing step subsequent to that shown by FIG. 3.

[0014]FIG. 5 is a cross-sectional view of the FIG. 1 semiconductor waferfragment at a processing step subsequent to that shown by FIG. 4.

[0015]FIG. 6 is a cross-sectional view of the FIG. 1 semiconductor waferfragment at a processing step subsequent to that shown by FIG. 5.

[0016]FIG. 7 is a cross-sectional view of the FIG. 1 semiconductor waferfragment at a processing step subsequent to that shown by FIG. 6.

[0017]FIG. 8 is a cross-sectional view of the FIG. 1 semiconductor waferfragment at a processing step subsequent to that shown by FIG. 7.

[0018]FIG. 9 is a cross-sectional view of the FIG. 1 semiconductor waferfragment at a processing step subsequent to that shown by FIG. 8.

[0019]FIG. 10 is a cross-sectional view of the FIG. 1 semiconductorwafer fragment at a processing step subsequent to that shown by FIG. 9.

[0020]FIG. 11 is an enlarged plan view of a fragmentary portion of aperipheral circuitry area of a semiconductor wafer fragment at oneprocessing step in accordance with the invention.

[0021]FIG. 12 is a view along line 12-12 in FIG. 11 and corresponds tothe FIG. 5 processing step.

[0022]FIG. 13 is view of the FIG. 12 peripheral circuitry areafragmentary portion at a processing step subsequent to that shown byFIG. 12, and one which corresponds to the FIG. 6 processing step.

[0023]FIG. 14 is a cross-sectional view of the FIG. 1 semiconductorwafer fragment at a processing step subsequent to that shown by FIG. 10.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0024] This disclosure of the invention is submitted in furtherance ofthe constitutional purposes of the U.S. Patent Laws “to promote theprogress of science and useful arts” (Article 1, Section 8).

[0025] Referring to FIG. 1, a semiconductive substrate in process isindicated generally with reference number 10. Such is comprised of abulk monocrystalline silicon substrate 12 having various layersdeposited or otherwise formed thereover. In the context of thisdocument, the term “semiconductive substrate” is defined to mean anyconstruction comprising semiconductive material, including, but notlimited to, bulk semiconductive materials such as a semiconductive wafer(either alone or in assemblies comprising other materials thereon), andsemiconductive material layers (either alone or in assemblies comprisingother materials). The term “substrate” refers to any supportingstructure, including, but not limited to, the semiconductive substratesdescribed above.

[0026] A plurality of conductive lines 14, 16, 18 and 20 are formed oversubstrate 10. In the depicted section conductive lines 14, 20 are formedover field oxide or field isolation regions 22, 24 respectively.Conductive lines 16, 18 are formed over a substrate active area 40.Conductive lines 14-20 are preferably anisotropically etched and include11 a polysilicon layer 26, a silicide layer 28 thereatop, and a suitableprotective insulative capping layer 30 atop silicide layer 28. Suitablesidewall spacers 32 are formed over respective sidewalls of theconductive lines. Other conductive line constructions are possible. Asso formed, conductive lines 14-20 are laterally spaced apart oversubstrate 10 and define therebetween respective diffusion regions orcircuit nodes 34, 36 and 38 with which electrical connection is to bemade.

[0027] A portion of a memory array area is designated generally byreference numeral 42. Such is defined relative to substrate 10 andcomprises, in accordance with a preferred aspect of this invention, aportion of a DRAM memory array. The preferred DRAM memory array alsoincludes a peripheral circuitry area which is operably associated withmemory array area 42 and described in more detail below.

[0028] Referring to FIG. 2, a first layer 44 is formed over substrate10. Layer 44 preferably comprises a first oxide layer ofborophosphosilicate glass (BPSG). Layer 44 is subsequently planarizedthrough mechanical abrasion of the substrate or a suitable dry etch. Anexemplary implementation is chemical-mechanical planarization whicheffectively provides a generally planar first layer surface 45, theplane of which is diagrammatically indicated at 45a.

[0029] Referring to FIG. 3, first layer 44 is patterned and etched toform openings 46, 48 and 50 to respective circuit nodes 34, 36 and 38.Opening 46 is disposed between conductive lines 14, 16. Opening 48 isdisposed between conductive lines 16, 18. Opening 50 is disposed betweenconductive lines 18, 20. Openings 46 and 50 define openings in whichcapacitor containers are to be formed. Opening 48 defines an opening inwhich a bit line contact is to be formed between the capacitorcontainers.

[0030] Referring to FIG. 4, a first material 52 is formed over substrate10 and between the conductive lines. Preferably, such material iselectrically conductive and is formed outwardly of and in electricalcommunication with respective circuit nodes 34, 36, and 38. Even morepreferably, such material comprises a conductively doped silicon orpolysilicon layer. According to one aspect of the invention, firstmaterial 52 is provided first to be substantially coplanar with planarfirst layer surface 45. Such is accomplished by first depositingmaterial 52 and subsequently planarizing the material, as by suitablemechanical planarization or a dry etch so that it is coplanar with first4 layer surface 45. Subsequently, a wet etch of material 52substantially selective to adjacent BPSG layer 44 can be conducted toclean the outwardly exposed surface of material 52 and to recess thematerial to a point below planar first layer surface 45 as shown.

[0031] In connection with the above-mentioned peripheral circuitry areawhich comprises part of the preferred DRAM memory array, a preferredaspect of the invention will now be described with brief reference to 11FIGS. 11-13. FIG. 11 shows a fragmentary portion of a peripheralcircuitry area at 100 which is formed relative to substrate 10.Peripheral circuitry area 100 includes at least one active contact area112 (shown in dashed lines) formed thereover to which electrical 11connection is desired to be made relative to an elevationally higherconductive line. Area 112 defines a length dimension L and a widthdimension W and constitutes a location which is remote on the substraterelative to the memory array. In the illustrated example, two conductivelines 114, 116 are shown extending generally widthwise of area 112.Typically, such lines are overlaid by one or more layers such as anelectrically insulative BPSG layer 44 (FIGS. 12, 13). Atop such layers,other conductive lines such as lengthwise-running lines 118, 120 areformed (FIG. 11). In this example, an electrical connection is desiredbetween conductive line 118 and underlying active area 112. It ispossible, however, to form a desired electrical connection as describedbelow at a peripheral circuitry area location which is not between theillustrated conductive lines 114, 116. For example, such electricalconnection can be made at an isolated peripheral circuitry arealocation.

[0032] According to one preferred implementation of the invention, aconductive peripheral line extension or elongated stringer 122 is formedto extend across a substantial portion of width dimension W. Lineextension 122 is connected with line 118 via a contact 121. Preferably,line extension or stringer 122 comprises the same conductive material 52(FIG. 4) which is also formed at the same time over memory array area42. Such is more readily apparent with reference to FIG. 12, which is aview taken along line 12-12 in FIG. 11 and shows conductive material 52formed between conductive lines 114, 116.

[0033] Referring to both FIGS. 5 and 12, a refractory metal layer 54 isformed over substrate 10 and the exposed outer surface of polysiliconlayer 52. Exemplary refractory metals include titanium, cobalt,molybdenum and tantalum.

[0034] Referring to FIGS. 6 and 13, substrate 10 is subjected toconditions which are effective to form a silicide layer 56 atopremaining portions of first material 52. Silicide layer 56 defines asecond conductive material which is formed over the first conductivematerial 52. Accordingly, the second conductive material is differentfrom the first conductive material and is preferably more conductivethan the first conductive material. In the preferred embodiment,silicide layer 56 comprises a silicide formed from a reaction between arefractory metal layer and the first conductive material (FIG. 5). Withrespect to line extension 122 (FIGS. 11 and 13), such comprises at leastone conductive line which is formed over the peripheral circuitry areaand which includes at least some of the silicide mentioned above.

[0035] Unreacted refractory metal layer 54 is subsequently stripped asby a suitable wet etch. An exemplary etch comprising H₂O: H₂O₂: NHH₄OH(5:1:1) suitably removes unreacted titanium while not etching theresultant silicide. Such etch also does not etch the BPSG 11 layer (FIG.6). Alternately, a plasma etch or suitable mechanical polishing can beused to remove the unreacted metal.

[0036] One of the advantages of the preferred line extensionconstruction (extension 122 of FIGS. 11 and 13) is that such providesreduced resistance in the connection between line 118 and active area112. This is most evident from FIG. 11 which shows that the lineextension extends across a substantial entirety of the width dimensionof the active area 112. Moreover, the preferred conductive extensionconstruction has a reduced resistance due in part to the presence of thesilicide component of the extension. Additionally in some circumstances,it is desirable to heavily dope the material from which extension 122 isformed. Such provides a source of dopants for the underlying active areawith outdiffusion therefrom serving to dope the desired area, such asdiffusion region 124 in FIGS. 12 and 13. However, such outdiffusion canalso affect or impact peripheral transistor operation in a negativemanner. The silicide component of the above described line extensioneffectively reduces undesirable outdiffusion elevationally outwardrelative to peripheral transistors and enables desirable outdiffusion tounderlying active areas.

[0037] Referring to FIG. 7, and with the unreacted refractory metalhaving been suitably removed or stripped, a masking layer 60 is formedover the second conductive layer or silicide layer 56 and firstinsulative layer 44. Preferably, masking layer 60 comprises aninsulative dielectric layer. Layers 52, 56 and 60 constitute a pluralityof layers, which are 11 formed on or over substrate 10. In theillustrated and preferred embodiment, such layers are three in numberand comprise different materials. Layer 56 constitutes a conductivelayer which is elevationally interposed between an upper insulatinglayer 60 and a lower conductive layer 52. According to theimplementation described in connection with FIGS. 11-13, an interposedlayer 56 is also formed in at least one other substrate location, anexemplary location being between conductive lines 114, 116 of FIG. 13.

[0038] Referring to FIG. 8, a layer of photoresist 63 is formed oversubstrate 10 and suitably patterned as shown to form or define openings62, 64.

[0039] Referring to FIGS. 9 and 10, a plurality of capacitor containeropenings 62, 64 are etched through layer 60 (FIG. 9) and layer 56 (FIG.10) in accordance with a preferred aspect of the invention. For purposesof the ongoing discussion, layer 60 comprises a first material and layer56 comprises a second material which is different from the firstmaterial. The etching of these layers or materials in the manner setforth just below enables capacitors to be formed in a manner whichalleviates concerns associated with undesirable variances in capacitancevalues which stem, in part, from the above described prior art timedetch.

[0040] Referring now specifically to FIG. 9, a first of the materials,here unmasked portions of layer 60 elevationally below openings 62, 64,is etched to a degree sufficient to outwardly expose at least some, andpreferably all, of the outer upper surface of silicide layer 56 (thesecond of the materials). Such forms a first part 66 of desiredcapacitor containers. According to a preferred implementation, such etchcomprises a first etching composition or chemistry which, upon detectionof and responsive to the outward exposure of layer 56, is changed to asecond etching composition or chemistry which is different from thefirst etching composition or chemistry. Subsequently, and through use ofsuch second etching composition or chemistry, the second of thematerials, here unmasked portions of layer 56 elevationally below firstcapacitor container part 66, is etched as shown in FIG. 10 to a degreesufficient to outwardly expose at least a portion, and preferablysubstantially all, of an upper outer surface of material 52. Such formsa second part 68 of desired capacitor containers. For purposes of thisdiscussion, remaining material 52 comprises a third material a portionof which is outwardly exposed by the second etching composition orchemistry. Further, such third material is preferably electrically -Tconductive and forms an electrical connection with conductively dopedsemiconductor material of, the substrate.

[0041] Alternately considered, an etch is conducted through maskinglayer 60 substantially selective relative to the second conductivematerial 56 (FIG. 9). Accordingly, an upper insulating layer is etchedor removed substantially selective relative to interposed conductivelayer 56 to form capacitor container first portion 66. Such etch ispreferably conducted to a degree sufficient to outwardly exposeelevationally lower layer 56. According to a preferred aspect of theinvention, masking layer 60 is etched downwardly using a first etchchemistry with an oxide component suitable for etching the BPSG materialfrom which layer 60 is formed. Preferably, such etch is conducted todegree which is sufficient to outwardly expose at least a surface ofsilicide layer 56. Such exposure is subsequently detected, such as bychemically detecting silicide material, whereupon the etch chemistry ischanged to one which is suitable for etching underlying or elevationallylower layer 56. FIG. 10 shows the resultant etch of elevationally lowerlayer 56 (FIG. 9). As so etched, second conductive material 56 is etchedthrough capacitor container first portions 66 and respective openings62, 64 substantially selective relative to remaining first material 52.Preferably, such etch outwardly exposes the first conductive material.

[0042] According to one aspect of the invention, such etch is conductedto be substantially selective relative to the first conductive material.According to another aspect of the invention, such outward exposure ofthe first conductive material can be detected and the second etch can beterminated. Such second etch preferably comprises etching the interposedconductive layer 56 substantially selective relative to the lowerconductive layer 52 to form capacitor container second portions 68.Subsequently, after formation of the preferred capacitor containers, athird electrically conductive material 70 is formed in respectiveopenings 62, 64 as shown in FIG. 14, and forms an electrical connectionif with material 52. Such comprises a further processing step in whichsuitable capacitor storage nodes are formed within and relative to theabove described capacitor containers. Subsequent processing to formsuitable capacitors can now take place in accordance with conventionalsemiconductor processing methods such as those which are incorporated byreference above or with methods to be developed in the future. Theperipheral circuitry areas of FIGS. 11-13 can be masked during the aboveprocessing.

[0043] Intermediate the formed capacitor containers, a composite stackof conductive material forms a buried contact interconnecting plug orlayer 57 (FIGS. 10 and 14). Such plug layer is constituted by an innerconductive polysilicon portion (the middle one of remaining layer 52)which is disposed elevationally below insulating dielectric layer 60 andadjacent node location 36. Accordingly, plug 57 includes an outersilicide portion 56 which is formed atop or over the inner conductiveportion. As shown and in accordance with a preferred aspect of theinvention, at least one and preferably two capacitor container contacts(respective remaining portions of layer 52) are disposed, one on eitherside of the middle layer 52.

[0044] In accordance with another preferred implementation, the abovedescribed FIG. 11 peripheral line extension or conductive extension 122is formed from the same material and preferably during the sameprocessing steps from and during which the buried contactinterconnecting plug layer is formed.

[0045] In compliance with the statute, the invention has been describedin language more or less specific as to structural and methodicalfeatures. It is to be understood, however, that the invention is notlimited to the specific features shown and described, since the meansherein disclosed comprise preferred forms of putting the invention intoeffect. The invention is, therefore, claimed in any of its forms ormodifications within the proper scope of the appended claimsappropriately interpreted in accordance with the doctrine ofequivalents.

1. A semiconductor processing method of forming a capacitor containercomprising: interposing a conductive layer between an upper insulatinglayer and a lower conductive layer over a substrate; etching the upperinsulating layer substantially selectively relative to the interposedconductive layer to form a capacitor container first portion; andetching the interposed conductive layer substantially selectivelyrelative to the lower conductive layer to form a capacitor containersecond portion.
 2. The semiconductor processing method of claim 1,wherein the interposed conductive layer is more conductive than thelower conductive layer.
 3. The semiconductor processing method of claim1, wherein the lower conductive layer comprises polysilicon and theinterposed conductive layer comprises a silicide material.
 4. Thesemiconductor processing method of claim 1 further comprising prior toelevationally interposing a conductive layer: forming conductivematerial comprising the lower conductive layer over the substrate in atleast one other substrate location, the location being remote from anarea in which the capacitor container is to be formed; and theinterposing including forming a conductive layer atop the conductivematerial formed in the at least one other substrate location.
 5. Asemiconductor processing method of forming a capacitor containercomprising: forming at least three layers of different materials over asubstrate; etching a first of the materials substantially selective to asecond of the materials to form a first part of a capacitor container;and etching the second of the materials substantially selective to athird of the materials to form a second part of the capacitor container.6. The semiconductor processing method of forming a capacitor containerof claim 5, wherein: the etching of the first of the materials comprisesa first etching composition which outwardly exposes at least some of thesecond of the materials, and further comprising detecting outwardexposure of the second of the materials and in response thereto changingthe first etching composition to a second etching composition which isdifferent from the first etching composition; and with the secondetching composition, etching the second of the materials to outwardlyexpose at least some of the third of the materials.
 7. The semiconductorprocessing method of forming a capacitor container of claim 5, whereinthe third material is electrically conductive and forms an electricalconnection with conductively doped semiconductor material of thesubstrate.
 8. The semiconductor processing method of forming a capacitorcontainer of claim 5, wherein the step of forming at least three layerscomprises forming a refractory metal layer over a silicon containinglayer and exposing the substrate to conditions effective to form asilicide atop the silicon containing layer.
 9. A semiconductorprocessing method of forming an electrical connection to a dopedsemiconductor material comprising: forming an active contact area havinga length dimension and a width dimension; and forming a contactinterconnecting plug outwardly of and to the active contact area throughelectrically insulative material, the plug comprising an innerpolysilicon portion and an outer silicide portion.
 10. The semiconductorprocessing method of claim 9, wherein the plug extends across asubstantial entirety of one of the active contact area length and widthdimensions.
 11. A semiconductor processing method of forming capacitorcontainers over a substrate comprising: forming a plurality ofconductive lines over a substrate; forming a first conductive materialover the substrate and between the conductive lines; forming a secondconductive material over the first conductive material, the secondconductive material being different from the first conductive material;forming a masking layer over the second conductive material; etching aplurality of capacitor container openings through the masking layersubstantially selective relative to the second conductive material; andetching the second conductive material through the capacitor containeropenings substantially selective relative to the first conductivematerial.
 12. The semiconductor processing method of claim 11, whereinthe second conductive material is more conductive than the firstconductive material.
 13. The semiconductor processing method of claim11, wherein the first conductive material comprises conductively dopedpolysilicon and the second conductive material comprises a silicideformed from a reaction between a refractory metal layer and the firstconductive material.
 14. The semiconductor processing method of claim11, wherein: the masking layer comprises borophosphosilicate glass(BPSG); the first conductive material comprises conductively dopedpolysilicon and the second conductive material comprises a silicideformed from a reaction between a refractory metal layer and the firstconductive material; and further comprising: the first etching outwardlyexposing the second conductive material; detecting outward exposure ofthe second conductive material and in response thereto, terminating thefirst etching; the second etching outwardly exposing the firstconductive material; and detecting outward exposure of the firstconductive material and in response thereto, terminating the secondetching.
 15. A semiconductor processing method of forming an integratedcircuitry memory device comprising: defining a memory array area andperipheral circuitry area relative to a substrate, the memory array areaand peripheral circuitry area including respective active areas; forminga conductively doped silicon layer over at least some active areas ofboth the memory array area and the peripheral circuitry area; forming arefractory metal layer over the silicon layer; exposing the substrate toconditions effective to form a silicide from the refractory, metal andsilicon layer; forming at least one conductive line over the peripheralcircuitry area which includes at least some of the silicide; and etchingportions of the silicide over the memory array active area to formcapacitor containers.
 16. The semiconductor processing method of claim15, wherein at least one peripheral circuitry active area includes alength and a width dimension and the at least one conductive line formedthereover extends substantially entirely across the width dimension. 17.The semiconductor processing method of claim further comprising: priorto the etching, forming a masking layer over the substrate; and whereinthe etching comprises: etching the masking layer substantially selectiveto the silicide and to a degree sufficient to outwardly expose at leasta portion of the silicide over the memory array active area-; andetching the exposed silicide substantially selective to the siliconlayer and to a degree sufficient to outwardly expose at least a portionof the silicon layer.
 18. A semiconductor processing method of making anelectrical connection to a circuit node comprising: forming a firstelectrically conductive material outwardly of and in electricalconnection with a circuit node; forming a second electrically conductivematerial outwardly of and in electrical connection with the firstelectrically conductive material; forming an insulative dielectric layeroutwardly of the second electrically conductive material; etching anopening in the insulative dielectric layer to the second electricallyconductive material; etching the second electrically conductive materialsubstantially selective relative to the first electrically conductivematerial; and after etching the second electrically conductive material,forming a third electrically conductive material in the opening inelectrical connection with the first electrically conductive material.19. The semiconductor processing method of claim 18, wherein at leasttwo of the three electrically conductive materials are the same.
 20. Thesemiconductor processing method of claim 18, wherein the firstelectrically conductive material is less conductive than the secondelectrically conductive.
 21. The semiconductor processing method ofclaim 18, wherein the first electrically conductive material comprisespolysilicon and the second electrically conductive material comprisessilicide formed from a refractory metal and the polysilicon.
 22. Asemiconductor processing method of forming a capacitor comprising:forming a substrate having a plurality of layers; etching an outer ofsaid layers to a degree sufficient to outwardly expose an elevationallylower layer; detecting outward exposure of the elevationally lowerlayer; upon said detecting, changing etch chemistry and etching theelevationally lower layer to a degree sufficient to outwardly expose anunderlying conductive layer and form at least a portion of a capacitorcontainer; and forming a capacitor within the capacitor container.
 23. Asemiconductor processing method of forming a capacitor over a substratecomprising: forming at least two spaced apart conductive lines over asubstrate active area; forming a first layer of insulative material overthe substrate and between the at least two spaced apart conductivelines; planarizing the first layer to define a generally planar firstlayer surface; patterning and etching the first layer between theconductive lines to form a first opening and to outwardly expose thesubstrate active area; forming a conductively doped polysilicon layer inthe first opening and in electrical connection with the substrate activearea; providing the polysilicon layer to be substantially coplanar withthe planar first layer surface; recessing the polysilicon layer withinthe first opening to below the planar first layer surface, thepolysilicon layer within the first opening having a polysilicon layerouter surface; forming a refractory metal layer over the polysiliconlayer outer surface; subjecting the substrate to conditions effective toform a silicide layer from the refractory metal layer and thepolysilicon layer; forming a second layer of insulative material overthe silicide layer and the first layer of insulative material; etching asecond opening through the second layer of insulative material and thefirst opening to a degree sufficient to outwardly expose the silicidelayer; etching the silicide layer to a degree sufficient to outwardlyexpose the polysilicon layer; and forming a capacitor within the firstand second openings in electrical connection with the polysilicon layer.24. A semiconductor processing method of forming a capacitor containerover a substrate comprising: forming a plurality of conductive linesover a substrate, the conductive lines defining at least one circuitnode therebetween; forming a first material comprising conductivelydoped polysilicon over the substrate and between the conductive lines,the first material being in contact with the at least one circuit node;forming a refractory metal layer over the first material; exposing thesubstrate to conditions effective to form a silicide from the refractorymetal layer and the first material, the silicide constituting a secondmaterial which is formed over the first material; forming a maskinglayer over the second material, the masking layer comprisingborophosphosilicate glass; etching at least one capacitor containeropening through the masking layer to outwardly expose the secondmaterial, the etching being conducted substantially selective relativeto the second material and elevationally over the at least one circuitnode; detecting outward exposure of the second material and in responsethereto, terminating the etching; after the terminating of the etching,etching outwardly exposed second material through the at least onecapacitor container opening substantially selective relative to thefirst material and to a degree sufficient to outwardly expose the firstmaterial; and detecting outward exposure of the first material and inresponse thereto, terminating the etching of the second material.
 25. Aburied contact interconnecting plug formed through an insulatingdielectric layer comprising: an inner conductive polysilicon portiondisposed on a substrate node location; and an outer silicide portionformed atop the inner conductive portion.
 26. The buried contactinterconnecting plug of claim 25 further comprising at least onecapacitor container contact disposed laterally adjacent the innerconductive polysilicon portion, the capacitor container contactcomprising the same material as the inner conductive polysiliconportion.
 27. The buried contact interconnecting plug of claim 25 whereinthe inner conductive polysilicon portion comprises a portion of a memoryarray area, and further comprising: a peripheral circuitry area formedover the substrate and operably associated with the memory array area;and at least one conductive line comprising a part of the peripheralcircuitry area formed from the same material as the buried contactinterconnecting plug layer.